SU-8: A THICK PHOTO-RESIST FOR MEMS

Great news! SOTEC m has developped... a liquid remover that really works with SU-8! See below...

Introduction
Physical properties
Other properties
Process tips
Research links
Commercial solutions
Litterature reference

(created 01/99 - modified 22/02/01)

Introduction

I hope this page will eventually contain all the known data about the SU-8 photoresist. Thus, I need your help! Send me all your data number 16525, and I will include it in this page, with credits, of course!

The SU-8 is a negative, epoxy-type, near-UV photoresist based on EPON SU-8 epoxy resin (from Shell Chemical) that has been originally developed, and patented (US Patent No. 4882245 (1989) and others) by IBM. This photoresist can be as thick as 2 mm and aspect ratio >20 have been demonstrated with a standard contact lithography equipment. These astounding results are due to the low optical absorption in the UV range which only limits the thickness to 2 mm for the 365nm-wavelength where the photo-resist is the most sensitive (i.e., for this thickness 100% absorption occurs).
Of course LIGA still yield better results but low-cost application will undoubtedly benefit from this resist that is well suited for acting as a mold for electroplating because of its relatively high thermal stability (Tg>200C for the cross-linked (i.e., exposed) resist).

Two companies have now bought a license from IBM to sell the photoresist :

In France, a representative from MCC is Chimie Tech Services (Claude Denis, Annabel Nerozzi), 7, rue Marcelin Berthelot - Zone Industrielle, 92762 Antony Cedex, Tel: +33 01 55 59 55 75 FAX: +33 01 55 59 55 90

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Physical properties

Using the litterature reference, the following tables, based on an original compilation from Loren St Clair, gives some properties of the resist. We begin with the known mechanical properties:

Table 1 : Mechanical properties of the SU-8 photoresist.
Characteristics Value Conditions Reference
Modulus of elasticity : E 4.02 GPa in tension, postbaked at 95C, screw tensile testing machine Lorenz97
4.95 +/- 0.42 GPa hardbaked at 200C, beam deflexion test Dellmann97
4.4 GPa postbake at 95C, SM blend SOTEC MICRO
Bi-axial modulus of elasticity : E/(1 - n) 5.18 +/- 0.89 GPa postbaked at 95C, thermal cycling test on Si wafer Lorenz98c
Poisson ratio 0.22 postbaked at 95C, SM blend SOTEC MICRO
Film stress 19 - 16 Mpa for 0 - 400 mic. thick SU-8 film coated on a 3" 375 mic. thick Si wafer, prebaked, illuminated, postbaked at 95C and brought back to room temperature (20C) Lorenz98c
Max stress 34 Mpa hardbaked at 200C, lateral deflexion FEM analysis Dellmann97
Max sheer 0.009 hardbaked at 200C, lateral deflexion FEM analysis Dellmann97
Plastic domain limit 'no' plastic domain observed hardbaked at 200C, sample pulled until fracture Lorenz97
Friction coefficient : m 0.19 postbaked at 95C, pin-on-disc installation (10 g load) Lorenz97

The next table gives data about physical properties of the polymerized SU-8:

Table 2 : Physical properties of the SU-8 photoresist.
Characteristics Value Conditions Reference
Glass temperature: Tg ~50C unexposed film (not polymerized) LaBianca95a
>200C fully crosslinked film (exposed and post (hard?) baked) LaBianca95a
~55C MCC blend before PEB MCC
Degradation temperature: Td ~380C fully crosslinked film (exposed and post (hard?) baked) LaBianca95a
Coefficient of thermal expansion : CTE 52.0 +/- 5.1 ppm/K SM10#0 postbaked at 95C, thermal cycling test on Si wafer Lorenz98c
30 ppm/K SM2050 with 50% filler in the blend SOTEC MICRO
21 ppm/K SM2070 with 70% filler in the blend
Thermal conductivity 0.2 W/mK general value for thermoplastic not for SU-8 Guerin97
Polymer shrinkage 7.5% postbaked at 95C Guerin97
Kinematic viscosity 265 cSt
989 cSt
2646 cSt
14953 cSt
52407 cSt
SU-8 5 (52% solid), density 1.1641, 20C
SU-8 10 (59% solid)
SU-8 25 (63% solid)
SU-8 50 (69% solid)
SU-8 100 (73% solid)
MCC
Viscosity 15 Pa.s
1.5 Pa.s
0.059 Pa.s
SM1070 (70% solid +GBL) 
SM1060 (60% solid +GBL) DIN 53 019 
SM1040 (40% solid +GBL)
Lorenz97
SOTEC MICRO.

And this table gives data about the electromagnetic properties of the polymerized SU-8:

Table 3 : Electromagnetic properties of the SU-8 photoresist.
Characteristics Value Conditions Reference
refractive index: n 1.8 at 100 GHz, postbaked at 100C (+8 hours at 65C in KOH), THz time domain spectroscopy Arscott99
1.7 at 1.6 THz, idem
1.67 at 365 nm, not crosslinked (during exposure before PEB) MCC
1.67 at 408 nm, idem
absorption coefficient: a ~2 cm-1 at 100 GHz, postbaked at 100C (+8 hours at 65C in KOH), THz time domain spectroscopy Arscott99
~40 cm-1 at 1.6 THz, idem
relative dielectric constant: er 4 at 10 MHz, postbaked at 100C, may be valid between 20 GHz and 40 GHz Thorpe98
3 at 10 MHz, postbaked at 95C, SM blend SOTEC MICRO

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Other properties

Here are some general properties that can not fit in a table, and are deducted mostly from experiment. They should not be taken for more than that :-)

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Process Tips

Here are all the data gathered over the years pertaining to the SU-8 processing. These datas complete the general information you may obtain from the literature, and are mostly tricks. But they do help a lot :-) Contact in bracket gives the source of the info. The textis almost verbatim from the source, with only very slight edition when it was needed. When some details are 'not available', it is mostly because of some proprietary information that could not be divulged openly. Sometimes, SU-8 processing looks more like an art than like an exact science :-)

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Research Links

Here is a list of further links to more information on research done with the resist. Enjoy.

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Commercial Solution

Here is a list of commercial products or commercial application related to the SU-8. If you don't have time to develop your own process... it is a very good alternative :-) Still, you may want to contact the companies cited to get some tricks for free... or sell yours :-) Oh, BTW, they are of course listed at no charge, so if you want to be there just drop me a line :-)

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Litterature Reference

Further very useful information (and the previous one :-) from the IBM and the EPFL teams (and a few others...) may be found in the following papers (please contact me if you know other references :-) This list was established with the help of Loren St CLAIR, Hubert LORENZ, Arnaud BERTSCH, Marc HEUSCHKEL, Patrick MOUNAIX, and LING Zhong-Geng. It is used by Microchem in their SU-8 bulletin board, thus it must be a good list :-)
  1. D. Stumbo, and J. Wolfe, "Ion exposure characterization of a chemically amplified epoxy resist", J. Vac. Scien. Technol. B 11 (1993) : 2432-2435 : an early paper for those interested in proton exposure with SU-8 (thin layer).
  2. N. LaBianca, and J. Delorme, "High aspect ratio resist for thick film applications", in Proc. SPIE vol. 2438, SPIE, (1995) : 846-852 : the first (?) attempt to use thick layer of SU-8. By the IBM team.
  3. N. LaBianca, J. Gelorme, K. Lee, E. Sullivan,and J. Shaw, "High aspect ratio optical resist chemistry for MEMS applications", in Proc. 4th Int. Symp. on Magnetic Materials, Processes, and Devices, The Electrochem. Soc., 95-18 (1995), pp.386-396
  4. K. Lee, N. LaBianca, S. Rishton, and S. Zohlgharnain, "Micromachining applications for a high resolution ultra-thick photoresist", J. Vac. Scien. Technol. B 13 (1995) : 3012-3016 : the first (?) attempt to use thick layer of SU-8 for micromachining, describing the use as a mask for deep silicon etching and as a mold for nickel electroplating. By the IBM team.
  5. H. Lorenz, M. Despont, N. Fahrni, N. Labianca, P. Vettiger, and P. Renaud, "EPON SU-8 : A low-cost negative resist for MEMS", in Proc. of Micro Mechanics Europe'96, Barcelona, (1996) : 32-35 : first paper of the IBM/EPFL team.
  6. J. M. Shaw, J. D. Gelorme, N. C. LaBianca, W. E. Conley, and S. J. Holmes, "Negative photoresists for optical lithography", IBM Journal of Research and Development 41(1997) : 81-94 : entertaining paper about the genesis of the chemistry for the SU-8 and some application written by the inventors of the resist (online paper, great!)
  7. M. Despont, H. Lorenz, N.Fahrni, J. Brugger. P. Renaud, and P. Vettiger, "High aspect ratio ultrathick, negative-tone near-UV photoresist for MEMS applications", in Proc. MEMS'97, IEEE, Nagoya, (1997) : 518-522 : ... and the SU-8 is reveled to an incredulous MEMS world :-)
  8. H. Lorenz, M. Despont, M. Fahrni, N. LaBianca, P. Vettiger, and P. Renaud , "SU-8: a low-cost negative resist for MEMS", J. Micromech. Microeng 7(1997) : 121-124 : First journal paper of the EPFL team, from the work presented at the Micro Mechanics Europe'96 conference. Gives some deposition parameters and a simple mechanical characterization.
  9. L. Dellmann, S. Roth, C. Beuret, G. Racine, H. Lorenz, M. Despont, P. Renaud, P. Vettiger, and N. de Rooij, "Fabrication process of high aspect ratio elastic structures for piezoelectric motor applications", in Proc. Transducers 1997, Chicago, (1997) : 641-644
  10. L. Guerin, M. Bossel, M. Demierre, S. Calmes, and P. Renaud, "Simple and low cost fabrication of embedded microchannels by using a new thick-film photoplastic", in Proc. Transducers 1997, Chicago, (1997) : 1419-1422
  11. A. Bertsch, H. Lorenz, and P. Renaud, "Combining microstereolithography and thick resist UV lithography for 3D microfabrication", in Proc. MEMS'98, IEEE, Heidelberg, (1998) : 18-23 : The title explains it all...
  12. B. Eyre, J. Blosiu and D. Wiberg, "Taguchi Optimization for the processing Epon SU-8 resist", in Proc. MEMS'98, IEEE, Heidelberg, (1998) : 218-222 : gives optimized process variables such as softbake time, exposure time, post-exposure time, develop time and substrate type for SU-8 with 73% solvent that were obtained with the Taguchi method for three typical thickness 50mic., 100 mic., and 220 mic.
  13. H. Lorenz, M. Despont, N.Fahrni, J. Brugger. P. Renaud, and P. Vettiger, "High aspect ratio ultrathick, negative-tone near-UV photoresist and its applications for MEMS", Sens. & Act. A A64(1998) : 33-39 : Expanded version of the MEMS'97 paper. It describes process, results (aspect ratio up to 18, thickness up to 1.2 mm) and application of the SU-8 (including the use of the resists as a structural material (photoplastic) and multi-level patterning).
  14. M. Heuschkel, L. Guérin, B. Buisson, D. Bertrand, and P. Renaud, "Buried microchannels in polymer for delivering of solutions to neurons in a network", Sensors & Actuators: B. Chemical 48/1-3 (1998) : 356-361
  15. W. Flack, W. Fan, and S. White, "Optimization and characterization of ultrathick photoresist films", in Proc. Advances in Resist Technology and Processing XV, Proc. SPIE Vol. 3333, SPIE (1998) : 1288-1303 : a paper from Ultratech Stepper describing experiment with the SU-8 and their 1Xstepper. They concluded that SU-8(25) showed no photo-sensitivity in the gh-line spectrum (390-450 nm) and they used i-line stepper (355-375 nm) to pattern line with an aspect ratio of 1.2 (sic) in a 25mic. thick layer giving a fully detailed process ... (online paper, great!)
  16. J. Thorpe, D. Steenson, and R. Miles, "High frequency transmission line using micromachined polymer dielectric", Electron. Lett. 34 (1998) : 1237-1238 : using SU-8 as insulation dielectric for mm-wave transmission line in copper between 20 GHz and 40 GHz.
  17. H. Lorenz, M. Despont, P. Vettiger, and P.Renaud, "Fabrication of photoplastic high-aspect ratio microparts and micromolds using SU-8 UV resist", Microsyst. Technol. 4 (1998) : 143-146 : more example of photoplastic use and complete description of the patented MIMOTEC process where the SU-8 is used to create metallic multilevel mold by repeated coating and patterning followed by electroplating and removal of the resist.
  18. L. Dellmann, S. Roth, C. Beuret, L. Paratte, G.-A. Racine, H. Lorenz, M. Despont, P. Renaud, P. Vettiger, and N. de Rooij, "Two steps micromoulding and photopolymer high-aspect ratio structuring for applications in piezoelectric motor components", Microsyst. Technol. 4 (1998) : 147-150 : complex use of the SU-8 with a detailed process.
  19. H. Lorenz, M. Laudon, and P. Renaud, "Mechanical characterization of a new high-aspect-ratio near UV-photoresist", Microelec. Engin. 41/42 (1998) : 371-374 : first attempt at a comprehensive mechanical characterization of the SU-8.
  20. C. Malek, "Mask prototyping for ultra-deep X-ray lithography: preliminary studies for mask blanks and high-aspect-ratio absorber patterns", in Proc. SPIE vol. 3512, SPIE (1998) : 277-285 : investigates the SU-8 for electroplating thick X-LIGA mask absorber. They also patterned SU-8 with X-ray and found it 'over one order of magnitude' more sensible than PMMA (X 25 with 50 mic. thick film) and, to present thickness-independant incident dose. An interesting point to note, with X-ray you don't have reflection from the substrate and hence no standing wave in the resist, yielding really smooth sidewalls...
  21. S. Arscott, F. Garet, P. Mounaix, L. Duvillaret, J.-L. Coutaz, and D. Lippens, "Terahertz time-domain spectroscopy of films fabricated from SU-8", Electron. Lett.35 (1999) : 243-244 : measurement of the refractive index (n) and the absorption coefficient (a) of the SU-8 between 100 GHz and 1.6 THz. Moreover they show results of an interesting double exposure experiment, allowing to insulate different thickness of photoresist from a single layer!
  22. M. Campbell, D. N. Sharp, M. T. Harrison, R. G. Denning, and A. J. Turberfield, "Fabrication of photonic crystals for the visible spectrum by holographic lithography", Nature 404 (2000) : 53 - 56 : the title says it : fabrication of 3-D photonic bandgap crystal working in the visible spectrum... but omits to tell it is using the SU-8! Will it be the killer application? :-)
  23. Zhong-geng Ling, Kun Lian, Linke Jian, "Improved patterning quality of SU-8 microstructures by optimizing the exposure parameters", in Proc. SPIE vol. 3999, SPIE (2000) : 1019-1027 : at last, a thorough investigation of the SU-8 absorption in the UV and up to the NIR, leading to many process improvements (aspect ratio 25 with 360um thick layer). Very interesting!

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